Tescan
The TESCAN S8000X is a versatile instrument for the characterization of materials. It combines a plasma-source focused ion beam microscope and a high-resolution BrightBeam scanning electron microscope.[1]
The instrument is equipped with advanced analytical capabilities, including Time-of-Flight Secondary Ion Mass Spectrometery and an Energy Dispersive x-ray spectrometer. It also includes a cryogenic stage, a sample transfer loadlock, and a cryogenic Kleindiek nanomanipulator.[1]
The focused ion beam microscope uses a Xe+ ion plasma source. The Xe plasma can generate a focused beam up to 1 uA, which allows very high milling rates and does not lead to deleterious ion implantation in the same way that Ga+ ions do.[1]
The BrightBeam SEM is a field-free, ultra-high resolution electron microscope whose optics allow improved resolution, even at low energies. This improves imaging of non-conducting samples.[1]
Time-of-Flight Secondary Ion Mass Spectrometery detects ions emitted from the sample, allowing chemical characterization. An Energy Dispersive x-ray spectrometer provides additional, complementary chemical characterization.[1]
The instrument is used for characterization of materials. Its cryogenic stage and sample transfer loadlock allow work down to -160 C or introduction of frozen samples into the tool to be milled.[1]
A cryogenic Kleindiek nanomanipulator enables users to interact with the sample in-situ as well as lift-out frozen sections for subsequent TEM analysis.[1]
The BrightBeam SEM improves imaging of non-conducting samples. ToF-SIMS is especially useful in detecting light elements, including the discrimination of hydrogen and deuterium.[1]
The Xe plasma focused beam allows very high milling rates. The instrument is also equipped for additional, complementary chemical characterization with EDS.[1]
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The following facts about the S8000X are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the S8000X are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the S8000X are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the S8000X are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the S8000X are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the S8000X is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Last updated Jul 29, 2026.
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