S8000X

The Tescan S8000X is a FIB/SEM instrument for materials characterization. The Tescan S8000X combines a plasma-source focused ion beam microscope with a high-resolution BrightBeam scanning electron microscope. The Tescan S8000X is equipped with Time-of-Flight Secondary Ion Mass Spectrometry, an energy-dispersive X-ray spectrometer, a cryogenic stage, a sample transfer loadlock, and a cryogenic Kleindiek nanomanipulator.^[1][2][3]

Focused ion beam and scanning electron microscope systems pair material removal with electron imaging in one chamber. Focused ion beams mill, section, or modify local regions of a specimen, while scanning electron microscopy images surface topography and contrast from the exposed area. Integrated chemical analysis can extend the platform from structural inspection into localized compositional investigation. Cryogenic handling on machines of this class supports work on temperature-sensitive or frozen specimens and helps preserve native structure during transfer and processing.

The Tescan S8000X includes a cryogenic stage and a sample transfer loadlock that allow work down to -160 C or introduction of frozen samples for milling. The Tescan S8000X includes a cryogenic Kleindiek nanomanipulator that enables in-situ interaction with the sample and lift-out of frozen sections for subsequent TEM analysis.^[1][2][3]

The Tescan S8000X is used for characterization of materials. The Tescan S8000X supports chemical characterization through ToF-SIMS and EDS. The Tescan S8000X is especially useful for detecting light elements, including discrimination of hydrogen and deuterium. The Tescan S8000X improves imaging of non-conducting samples through low-energy SEM performance.^[1][2][3]