Teradyne
Nextest Magnum I PV alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Advantest
93000 Smart Scale
Test & Probe
The Advantest 93000 Smart Scale is a test and probe system used in semiconductor device evaluation and sorting. Machines of this class are used to contact device sites, apply test conditions, and record electrical responses for production screening and characterization.
Advantest
93000 SOC
Test & Probe
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
LTX-Credence
ASL 1000
Test & Probe
The LTX-Credence ASL 1000 is a test and probe machine used to electrically evaluate semiconductor devices and circuit structures before final assembly or further processing. Machines of this class combine probing and automated test functions to identify devices that meet electrical criteria and to screen out defective parts.
LTX-Credence
ASL 3000
Test & Probe
KLA
1007
Test & Probe
The KLA 1007 is a wafer prober manufactured by KLA.
Electroglas
1034
Test & Probe
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.
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