Waferpedia

Tool family

Applied Materials UVision

Models in this family

  1. Applied Materials UVision 200 Brightfield is a brightfield inspection system with standard startup specifications and an optional E84 OHT P I/O sensor option.

  2. Applied Materials UVision 3 Brightfield is an inspection tool described with a FOUP-based loading configuration and Windows XP operating software.

  3. Applied Materials UVision 600 SP is an inspection system configured with FOUP loading, ASYST Isoport loadport, and Windows XP operating software.

  4. The Applied Materials UVision SP 200 is a brightfield wafer inspection tool for 12-inch wafers.

All entries

  1. UVision 200 BrightfieldApplied Materials

    Applied Materials UVision 200 Brightfield is a brightfield inspection system with standard startup specifications and an optional E84 OHT P I/O sensor option.

    CategoryMetrology & Inspection
    8 specs
  2. UVision 3 BrightfieldApplied Materials

    Applied Materials UVision 3 Brightfield is an inspection tool described with a FOUP-based loading configuration and Windows XP operating software.

    CategoryMetrology & Inspection
    9 specs
  3. UVision 600 SPApplied Materials

    Applied Materials UVision 600 SP is an inspection system configured with FOUP loading, ASYST Isoport loadport, and Windows XP operating software.

    CategoryMetrology & Inspection
    8 specs
  4. UVision SP 200 Brightfield WaferApplied Materials

    The Applied Materials UVision SP 200 is a brightfield wafer inspection tool for 12-inch wafers.

    CategoryMetrology & InspectionWaferTool scans a wafer in a meander path
    10 specs