Tool family
The KLA Candela 6120 Surface Inspection System is a surface inspection tool for 8-inch wafers.
The KLA Candela 6310 Surface is a surface inspection system in the Metrology & Inspection category.
The KLA Candela 7100 is a hard disk surface analyzer used for defect inspection and related surface analysis tasks.
The KLA Candela 8720 Surface Defect is an automated surface and epitaxial defect inspection system for LED, photonics, communications, and other compound semiconductor applications.
The KLA Candela CS 920 Surface Analyzer is a metrology and inspection tool that includes a PSC Calibration Wafer.
The KLA Candela 6120 Surface Inspection System is a surface inspection tool for 8-inch wafers.
The KLA Candela 6310 Surface is a surface inspection system in the Metrology & Inspection category.
The KLA Candela 7100 is a hard disk surface analyzer used for defect inspection and related surface analysis tasks.
The KLA Candela 8720 Surface Defect is an automated surface and epitaxial defect inspection system for LED, photonics, communications, and other compound semiconductor applications.
The KLA Candela CS 920 Surface Analyzer is a metrology and inspection tool that includes a PSC Calibration Wafer.