KLA

Surface inspection systems are metrology and inspection tools used to examine wafer or substrate surfaces for defects and surface-condition issues. Surface inspection systems typically support process control by finding particles, scratches, pits, stains, and other visible or optically detectable abnormalities before later process steps add value to a defective substrate.
Surface inspection systems are used at control points where substrate surface quality must be checked before subsequent processing or after a process step that can introduce defects. Surface inspection systems are commonly placed around incoming substrate qualification, post-clean verification, and post-process defect monitoring so that excursion lots can be identified before more fabrication steps are performed.
Surface inspection systems are applied where frontside or backside surface condition affects yield, device reliability, bonding, coating, lithography, or downstream handling. Surface inspection systems are also used on disk-shaped substrates and similar precision surfaces when defect review focuses on surface cleanliness, scratches, and other surface imperfections rather than electrical test.
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The following facts about the Candela 6120 Surface are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Candela 6120 Surface are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Candela 6120 Surface are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Candela 6120 Surface are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Candela 6120 Surface are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Candela 6120 Surface is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 16, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.