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KLA

Candela 6120 Surface

Metrology & InspectionKLA Candela family
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Candela 6120 Surface — Inventory photo
Fig. 01Candela 6120 SurfaceInventory photo[1]

What it is

General reference — not yet source-verified

Surface inspection systems are metrology and inspection tools used to examine wafer or substrate surfaces for defects and surface-condition issues. Surface inspection systems typically support process control by finding particles, scratches, pits, stains, and other visible or optically detectable abnormalities before later process steps add value to a defective substrate.

Where it fits in the process flow

General reference — not yet source-verified

Surface inspection systems are used at control points where substrate surface quality must be checked before subsequent processing or after a process step that can introduce defects. Surface inspection systems are commonly placed around incoming substrate qualification, post-clean verification, and post-process defect monitoring so that excursion lots can be identified before more fabrication steps are performed.

Applications

General reference — not yet source-verified

Surface inspection systems are applied where frontside or backside surface condition affects yield, device reliability, bonding, coating, lithography, or downstream handling. Surface inspection systems are also used on disk-shaped substrates and similar precision surfaces when defect review focuses on surface cleanliness, scratches, and other surface imperfections rather than electrical test.

What do the numbers mean?

Wafer handling2

Wafer sizes
8 inch[4]
Accurate?
Wafer size
8 inch[4]
Accurate?

Control & software3

HDD and Software Included[1]
Accurate?
HDD and Software Included
Yes[1]
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Included items
HDD and software included[1]
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Configuration & options13

Phase
Equipment Configuration: - 1 phase (620W) - 50/60Hz - Parallel connection and power connection - Test sample: 50 thickness, 95mm diameter DISK (both sides)[4]
Accurate?
Phase
1 phase (620W)[1]
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50/60Hz[1]
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Parallel Connection and Power Connection[1]
Accurate?
Test Sample
50 Thickness, 95 mm Diameter DISK (Both Sides)[1]
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Power
1 phase 620W, 50/60Hz[4]
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Vintage
2008[1]
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Make
KLA[4]
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Model
Candela 6120[4]
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Equipment type
Surface Inspection System[4]
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Power
1 phase (620W)[4]
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Frequency
50/60Hz[4]
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Connection
Parallel connection and power connection[4]
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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What wafer sizes does the Candela 6120 support?

The Candela 6120 supports 8-inch wafers.[4][1]

What are the power requirements for the Candela 6120?

The system operates on single-phase 620W power at 50/60 Hz.[4][1]

What test sample configuration is specified for the Candela 6120?

The system can accommodate a test sample of 50 thickness and 95 mm diameter disk, inspected on both sides.[4][1]

Not publicly documented

The following facts about the Candela 6120 Surface are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Candela 6120 Surface are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Candela 6120 Surface are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Candela 6120 Surface are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Candela 6120 Surface are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Candela 6120 Surface is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (4)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]Inventory photo
  3. [3]Inventory photo
  4. [4]inventory listing
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Last updated Oct 16, 2026.

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