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Tool family

Zeiss 15xx

ZeissMetrology & Inspection2 entries
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Models in this family

  1. 1540 EsB FIB-SEM

    The Zeiss 1540 EsB FIB-SEM is a focused ion beam and scanning electron microscope in the Metrology & Inspection category.

  2. 1550

    Cited variants

    DesignationGenerationVintageChangesSource
    LEO 1550———chemie.uni-hamburg.de[1]
    LEO (Zeiss) 1550 Field Emission SEM———nnci.net[2]

All entries

  1. 1540 EsB FIB-SEMZeiss

    The Zeiss 1540 EsB FIB-SEM is a focused ion beam and scanning electron microscope in the Metrology & Inspection category.

    CategoryMetrology & Inspection
    11 specs
  2. 1550Zeiss
    CategoryMetrology & Inspection
    11 specs

Sources

Sources (2)Every fact above is drawn from these public sources
  1. [1]chemie.uni-hamburg.dechemie.uni-hamburg.de
  2. [2]nnci.netnnci.net