JEOL
JEM-100B
The JEOL JEM-100B is a transmission electron microscope. The JEM-100B incorporated an electromagnetic deflection unit as well as an electromagnetic stigmator.[1]
Plate 01Microscopio electrónico de transmisión JEOL JEM 100B de la colección del MUNCYT
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What it is
How it works
General reference — not yet source-verifiedTransmission electron microscopes form images by sending an electron beam through a very thin specimen and using electron optics to project transmitted electrons into an image or diffraction pattern. Transmission electron microscopes use electromagnetic lenses and beam-control elements within a vacuum column to steer, focus, and correct the beam during observation.
Where it fits in the process flow
General reference — not yet source-verifiedTransmission electron microscopes are typically used off line rather than as in-line wafer-processing tools. Transmission electron microscopes support detailed structural inspection after specimen preparation, and they are commonly used after process steps when higher-magnification review or materials analysis is needed.
Applications
General reference — not yet source-verifiedTransmission electron microscopes are used for defect review, failure analysis, materials characterization, and process development. Transmission electron microscopes are applied to thin cross sections and other electron-transparent specimens to examine microstructure, interfaces, films, particles, and crystallographic features.
What do the numbers mean?
Configuration & options6
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What type of instrument is the JEOL JEM-100B?
The JEOL JEM-100B is a transmission electron microscope.[2]
Not publicly documented
The following facts about the JEM-100B are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the JEM-100B are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the JEM-100B are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the JEM-100B are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the JEM-100B are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the JEM-100B is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]en.wikipedia.org — en.wikipedia.orgen.wikipedia.org
- [2]JEM-100B — JEOL | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
- [3]JEOL JEM-100B family | Waferpedia — waferpedia.comwaferpedia.com
Last updated Oct 19, 2026.
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