Multitest

General referenceMultitest MT 2168 XT is a test and probe machine used to make electrical contact with semiconductor devices during evaluation and characterization. It belongs to the class of systems used to probe devices before final selection or further downstream test handling.

The Multitest MT 9308 SO is a handler used in semiconductor test and probe operations.

The Multitest MT 9510 STD is a handler described with temperature and high-voltage capabilities.

The Multitest MT93xx is a gravity handler for testing SO and MLF/QFN packages with 4 contact sites, tri-temp operation from -55 to 155°C, and maximum throughput of 20,500 uph.

General referenceMultitest MT 9308 is a test and probe system used to evaluate semiconductor devices by making temporary electrical contact to an uncut wafer or other device form. Machines of this class support electrical characterization and sorting before final packaging or release.

The Multitest MT8589 is a gravity handler with dual contact site, tri-temperature operation from -55 to 155 °C, and maximum throughput of 4,800 uph.

General referenceMultitest MT 9510 Tri-Temp is a test and probe system used to make electrical measurements on semiconductor devices before final assembly. It belongs to the class of equipment that combines device probing with automated test handling and temperature control during characterization and verification.

The Multitest MT 8704 is a test handler.

The Multitest MT 9038 is a handler described as a hot test handler with VIP Kelvin contact unit and SO8 HD test capability.