MT 8704

A semiconductor test handler is an automated part-handling machine used around electrical test operations for packaged devices. A handler typically presents individual devices to a contactor or test socket, manages the movement of parts through the test sequence, and sorts devices after test according to the test outcome.

A test handler automates the mechanical flow of packaged semiconductor devices into and out of the test interface. A handler typically singulates parts from an input format, transfers each part to the test position, maintains controlled device presentation at the contact site, and then routes the part to an output category after the tester completes its measurement sequence.

A test handler sits in backend semiconductor manufacturing at the packaged-device test stage rather than in wafer fabrication. A handler is paired with electronic test equipment after assembly and before final packing, binning, or shipment preparation. A handler is generally downstream of package assembly and upstream of final device classification and packing flows.

Test handlers are used for automated electrical test of packaged integrated circuits and other packaged semiconductor devices. Test handlers are commonly applied where repeatable device presentation, sorting, and thermal conditioning are needed during production test or characterization flows.