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Multitest

MT 2168 XT

Test & ProbeMultitest MT 2168 family
Research Quality: 30% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

MT 2168 XT — Inventory photo
Fig. 01MT 2168 XTInventory photo[1]

What it is

The Multitest MT 2168 XT is a handler from Multitest.[1][2][3][6][7]

What do the numbers mean?

Configuration & options2

OS Version
QNX[1]
Accurate?
Some parts taken out[5]
Accurate?

Vintage & configurations

Documented models & variants

DesignationGenerationVintageChangesSource
MT 2168 XT HandlerOS Version stated as QNX 2019 Vintage in one source, QNX 2020 Vintage in another source, and QNX 2021 Vintage in another source.Equipment inventory listing[3]
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What does a test and probe machine do?General reference — not yet source-verified

It creates controlled electrical contact to a device so that external instruments can measure its electrical behavior.

What is the main purpose of this machine class?General reference — not yet source-verified

The main purpose is to enable repeatable electrical testing of semiconductor devices before later processing or acceptance steps.

What kind of measurements are performed through probing?General reference — not yet source-verified

Machines of this class support measurements such as continuity, leakage, resistance, and other electrical checks defined by the test program.

Where is this equipment used in the semiconductor flow?General reference — not yet source-verified

It is used in device-level test operations before downstream packaging, sorting, or further handling.

Why is probe positioning important?General reference — not yet source-verified

Accurate probe positioning is needed to make reliable contact with the intended device site and to maintain measurement repeatability.

Not publicly documented

The following facts about the MT 2168 XT are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • Fewer than 3 independently cited specifications for the MT 2168 XT are on record; the remainder await public documentation.

    Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the MT 2168 XT are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • The control-system platform and OS era of the MT 2168 XT are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the MT 2168 XT are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the MT 2168 XT is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (9)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]Inventory photo
  3. [3]Inventory photo
  4. [4]Inventory photo
  5. [5]inventory listing
  6. [6]Equipment inventory listing
  7. [7]Equipment inventory listing
  8. [8]Equipment inventory listing
  9. [9]You searched for - Multitestmultitest.com (Sep 1, 2016)web.archive.org
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Last updated Jul 29, 2026.

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