Multitest
MT 9510 XP
The Multitest MT 9510 XP is a Pick&Place handler designed for tri-temp testing of semiconductor packages. The Multitest MT 9510 XP uses standard Plunge-to-Board contacting and delivers industry-leading temperature accuracy without modifications.[1]
What it is
General reference — not yet source-verifiedThe Multitest MT 9510 XP is a semiconductor test and probe handler.
How it works
The MT 9510 XP was evaluated with standard Plunge-to-Board contacting in a temperature-performance comparison.[1]
Where it fits in the process flow
The MT 9510 XP is used for tri-temperature testing in a manufacturing environment.[1]
Applications
The MT 9510 XP was evaluated on a BGA package with a 27 x 27 mm body size.[1]
Why won't it start?
Documented failure modes, common issues, and field considerations.
- Non operational
What do the numbers mean?
Power & electrical4
- 50/60 Hz[4]
Wafer handling2
Control & software3
- Option IEEE 488.2 Interface[4]
Configuration & options28
- A+H with 3MTM[2]
- Non operational[2]
- Included Options:[4]
- MT 9510 XP Base System Ambient / Hot 3MTM[4]
- Option Ionizer Kit MT 9510 XP Incl. Cooler[4]
- Option RGB Sensor 3MTM[4]
- Included Conversion Kit:[4]
- CK QFP 48 7x7 Quad site[4]
- Conversion Kit Quad Site Compatible with MT 9510 / MT 9510 XP for QFP Basic ESD Protection[4]
- Contact Unit Holder Quad Site:[4]
- Compatible with MT 9510 / MT 9510 XP Short contact[4]
- Tri-temp with Hot Air Purge[4]
- Tri-temp[3]
- Conversion kits
- CK QFP 48 7x7 Quad site, Conversion Kit Quad Site for QFP Basic ESD Protection Contact Unit Holder Quad Site[4]
Vintage & configurations
Documented models & variants
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Rasco SO 1000— Same function class: Test & Probe, nullCompare in depthsource[7]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What types of semiconductor devices can be tested on test and probe systems?General reference — not yet source-verified
Test and probe systems can handle a broad range of devices including logic ICs, memory chips, analog and mixed-signal circuits, RF components, MEMS sensors, and power devices. The specific test interface and instrumentation are configured according to the device type and test requirements.
What is the difference between a wafer prober and a package handler?General reference — not yet source-verified
A wafer prober contacts devices directly on the wafer using a probe card, allowing electrical tests before dicing. A package handler handles individual packaged devices, placing them into a test socket for final test after packaging. Both automate device handling and sorting but operate at different stages of the manufacturing flow.
How is test throughput determined in such systems?General reference — not yet source-verified
Throughput depends on factors such as test time per device, contact and index time (mechanical movements), parallel test capability (number of sites tested simultaneously), and handling speed. System designers optimize these parameters based on the specific device and production volume requirements.
What are common test parameters measured by these systems?General reference — not yet source-verified
Typical test parameters include DC measurements (leakage current, supply voltage thresholds), AC parameters (timing, rise/fall times), functional logic patterns, analog signal integrity (gain, distortion), and parametric values (resistance, capacitance). The specific tests are defined by the device datasheet and test program.
Not publicly documented
The following facts about the MT 9510 XP are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
The control-system platform and OS era of the MT 9510 XP are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the MT 9510 XP is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the MT 9510 XP are on record.
Answerable by: an OEM parts catalog or a service engineer
No publicly hosted manuals, SOPs, or datasheets for the MT 9510 XP are on record.
Answerable by: university cleanroom staff or an OEM application specialist
Sources & citations
Sources (7)Every fact above is drawn from these public sources
- [1]web.archive.org — multitest.com (Mar 21, 2006)web.archive.org
- [2]Equipment inventory listing
- [3]Equipment inventory listing
- [4]Equipment inventory listing
- [5]Inventory photo
- [6]Inventory photo
- [7]Equipment inventory listing
Last updated Oct 13, 2026.
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