ADE
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ADE AFS-3220 is wafer characterization metrology equipment. ADE AFS-3220 is currently configured for 300mm wafers. ADE AFS-3220 has an OEM manufacturing date of 2002.[1]
Documented failure modes, common issues, and field considerations.
How individual machines were equipped when they appeared on the secondary market — as listed, per unit. These describe one specific machine, not the model in general.
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The following facts about the AFS-3220 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the AFS-3220 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the AFS-3220 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the AFS-3220 are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the AFS-3220 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the AFS-3220 are on record.
Answerable by: an OEM parts catalog or a service engineer
Last updated Oct 19, 2026.
The Tokyo Semitsu Kogaku (TSK) UF200 is a production wafer prober configured for 200mm wafers.
The Hitachi CG 4100 is a CD-SEM (critical dimension scanning electron microscope) used for metrology and inspection of semiconductor wafers.