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ADVANTEST

T5377 Automated

Test & ProbeADVANTEST T5377 Automated family
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The ADVANTEST T5377 is an automated memory test system capable of simultaneously testing up to 256 DUTs per system at test speeds of up to 143/286 MHz in DDR mode. The T5377 is designed for wafer test of DRAMs and package test of Flash memory.[1]

ADVANTESTT5377 Automated
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What it is

The ADVANTEST T5377 is an automated test system designed for semiconductor memory devices.[1]

The T5377 is a memory tester that provides solutions for wafer test of DRAMs and package test of Flash memory.[1]

The system is fully compatible with its predecessor, the ADVANTEST T5375, allowing test programs and probe cards to be reused without modification.[1]

How it works

The T5377 is fitted with dual test heads, enabling it to test at two stations simultaneously.[1]

The system can simultaneously test up to 256 devices under test per system at test speeds of up to 143 or 286 MHz in DDR mode.[1]

The T5377 can capture fail data for large capacity memory devices, supporting functional testing and redundancy analysis for high density memory devices.[1]

An optional MRA4 ev2 redundancy analyzer can be selected for greater flexibility and efficiency in memory repair analysis.[1]

The system includes pattern generation via ALPG with configurable address and data lines, and supports parametric test units and programmable power supplies.[1]

Where it fits in the process flow

The system supports both wafer-level testing of DRAMs and final package testing of Flash memory devices.[1]

Applications

The T5377 is used for testing DRAM, SDRAM, DDR devices, SRAM, Flash memories, Direct RDRAM, EPROM, and Masked ROM.[1]

The system targets high-volume production testing of memory devices, with its simultaneous test capability improving throughput.[1]

What do the numbers mean?

Power & electrical3

Test speed
143/286 MHz (in DDR mode)[1]
Accurate?
Test heads
Up to 2 stations, High-voltage driver equipment, High-current driver equipment[1]
Accurate?
Programmable power supplies
Up to 256 units/station[1]
Accurate?

Optics & imaging1

Target devices
DRAM, SDRAM, DDR devices, SRAM, Flash memories, Direct RDRAM, EPROM, Masked ROM, etc.[1]
Accurate?

Configuration & options6

Target devices
DRAM, SDRAM, DDR devices, SRAM,[1]
Accurate?
Simultaneous testing
256 devices (128 devices x 2 stations, in the case of x 8 or x 9 bits)[1]
Accurate?
Pattern generation
ALPG; 18X, 18Y, 18D x 2 or 36D x 1[1]
Accurate?
Parametric test units
Up to 64 units/station[1]
Accurate?
Options
MRA4 (Memory Repair Analyzer) or AFM[1]
Accurate?
Test heads
Up to 2 stations[1]
Accurate?

Observed configurations

How individual machines were equipped when they appeared on the secondary market — as listed, per unit. These describe one specific machine, not the model in general.

Unit as listed[1]

  • Fitted with dual test heads
  • Options: MRA4 (Memory Repair Analyzer) or AFM
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Test speed143/286 MHz (in DDR mode)[1]
  • Test headsUp to 2 stations, High-voltage driver equipment, High-current driver equipment[1]
  • Programmable power suppliesUp to 256 units/station[1]

Where are the manuals?

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Not publicly documented

Field notes

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Not publicly documented

The following facts about the T5377 Automated are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the T5377 Automated are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the T5377 Automated are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the T5377 Automated are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the T5377 Automated are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the T5377 Automated is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]dealer listingfabsurplus.com
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Last updated Sep 24, 2026.

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