Agilent
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The Agilent E 3103 B is a tester for semiconductor wafer probing. The Agilent E 3103 B is commonly used with a Tel P8XL prober and a chiller.[1][2]
A test and probe tool makes electrical contact to a device or wafer so measurements and functional checks can be performed before later assembly steps.
A probe station typically uses a probe head or prober stage to position contacts precisely on pads, sites, or structures for device evaluation.
The Agilent E 3103 B fits in wafer test and probe operations rather than in front-end lithography or back-end packaging.
The Agilent E 3103 B is categorized for test and probe use.[2]
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The following facts about the E 3103 B are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the E 3103 B are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the E 3103 B are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the E 3103 B are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the E 3103 B are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the E 3103 B is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 11, 2026.
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