Agilent
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The Agilent PA 200 HS CV is a CV tester for 8-inch wafers.[1]
A wafer prober positions a wafer on a temperature-controlled chuck and brings an array of probe needles into contact with die pads to make electrical connections for parametric testing.
In a semiconductor fab, the PA 200 HS CV is used after wafer fabrication steps are complete, typically in the sort or parametric test area, to perform electrical test on individual die before final packaging.
Capacitance-voltage measurements are used to characterize semiconductor properties such as oxide thickness, doping profiles, and interface trap density in MOS devices.
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The following facts about the PA 200 HS CV are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
Fewer than 3 independently cited specifications for the PA 200 HS CV are on record; the remainder await public documentation.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the PA 200 HS CV are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the PA 200 HS CV are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the PA 200 HS CV are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the PA 200 HS CV are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
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Last updated Oct 5, 2026.
The Tenney TPS JR-A-F4T is a junior compact temperature test chamber with a 1.2 cubic foot chamber size and a temperature range of -68°C to +180°C.
The Rorze 03 RR 8120-001-001 is a wafer exchanger for 8-inch wafers.
The KLA 1007 is a wafer prober manufactured by KLA.