Applied Materials
Compass 200 Wafer
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Applied Materials Compass 200 Wafer Inspection System is a wafer inspection system. The Applied Materials Compass 200 Wafer Inspection System is model Compass 200. The Applied Materials Compass 200 Wafer Inspection System requires 3-phase, 208 VAC power.[1]
What it is
The Applied Materials Compass 200 is a wafer inspection system.[1]
How it works
General reference — not yet source-verifiedCommon inspection techniques include brightfield and darkfield imaging, each sensitive to different defect types. The system may employ multiple wavelengths and imaging modes to optimize detection sensitivity for various layers and materials.
Where it fits in the process flow
General reference — not yet source-verifiedDownstream from inspection, wafers may be sent to defect review tools for detailed analysis or to rework stations. The data generated is used for statistical process control and yield improvement activities.
What do the numbers mean?
Power & electrical3
Wafer handling1
Configuration & options3
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the Compass 200 Wafer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Compass 200 Wafer are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Compass 200 Wafer are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Compass 200 Wafer are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Compass 200 Wafer are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Compass 200 Wafer is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (1)Every fact above is drawn from these public sources
- [1]Inventory photo
Last updated Oct 11, 2026.
Compare with similar tools
View all →The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.
