Bruker

An atomic force microscope is a surface metrology and microscopy instrument. Atomic force microscopes are used to map surface topography by scanning a probe across a sample. Atomic force microscopes are part of nanoscale characterization workflows for measuring surface form and local surface-related properties.
Atomic force microscopes operate by moving a sharp probe relative to a sample surface and recording the interaction between the probe and the surface. Atomic force microscopes produce topographic data from that scanned interaction. Atomic force microscopes can also support modes that sense properties beyond height, depending on the head, holder, and application module installed.
Atomic force microscopes are used after a surface has been formed, patterned, etched, deposited, polished, or otherwise prepared for inspection. Atomic force microscopes fit into metrology and failure analysis flows where non-destructive surface characterization is needed. Atomic force microscopes are commonly used between process steps to verify topography, roughness, step formation, and localized surface behavior before additional fabrication or analysis.
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The following facts about the Dimension 3100 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Dimension 3100 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Dimension 3100 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Dimension 3100 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Dimension 3100 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Dimension 3100 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 18, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.