Waferpedia

Gaertner

MI108

Metrology & InspectionGaertner MI108 family
Research Quality: 30% complete
LinkedIn X Email
GaertnerMI108
No photo available yet

What is it?

The Gaertner MI108 Light-Sectioning Microscope is described as an instrument for technical testing of surfaces, with uses including examining fit and friction, wear and tear, surface contour, nicks, burr heights, groove depths, edge profile, anodized layer thickness, coating thickness, and film profile. It is described as portable or mountable in other holding devices, and it uses the Schmaltz concept with an adjustable slit, a 45-degree light beam, and a filar micrometer for measurement.

What can it run?

Process applications and technology nodes documented for this tool.

  • Technical testing of surfaces
  • Measurement of surface geometry
  • Study of fit and friction
  • Study of wear and tear
  • Measurement of surface contour
  • Measurement of nicks, burr heights, groove depths, and edge profile
  • Measurement of thickness of anodized layers, coating thickness, and film profile

What do the numbers mean?

Optics & imaging4

Objective magnification
3.48X[1]
Accurate?
Eyepiece magnification
10X[1]
Accurate?
Total magnification
34.8X[1]
Accurate?
Optical working distance
41.2 mm[1]
Accurate?

Configuration & options6

Instrument type
Light-sectioning microscope[1]
Accurate?
Model
MI108[1]
Accurate?
Concept
Schmaltz concept[1]
Accurate?
Light beam angle
45°[1]
Accurate?
Micrometer drum graduation
0.00002 inch per division (20 millionths)[1]
Accurate?
Standard equipment
Base, filtered light source, adjustable slit, filar micrometer eyepiece with external revolution counter, x-y positioning stage with .001 reading micrometer thimbles, fixed angular mount, vertical positioning stage[1]
Accurate?
Interested in this tool?
Embed spec card

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Not publicly documented

The following facts about the MI108 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the MI108 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the MI108 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the MI108 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the MI108 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the MI108 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]web.archive.org — web.archive.orgweb.archive.org
Was this page accurate?

Last updated Jul 29, 2026.

Compare with similar tools

View all →
.204 PSL WaferKLA

The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.

CategoryMetrology & Inspection
5 specs
MI108 vs .204 PSL Wafer →
.496 PSL WaferKLA

KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.

CategoryMetrology & Inspection
2 specs
MI108 vs .496 PSL Wafer →
0035235-003 MMD HeadKLA

The KLA 0035235-003 MMD Head is a TSTD PCB ASSY, MMD MEAS HEAD compatible with the KLA AIT-XP.

CategoryMetrology & Inspection
6 specs
MI108 vs 0035235-003 MMD Head →
1.112 PSL WaferKLA

The KLA 1.112 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 inspection systems.

CategoryMetrology & Inspection
5 specs
MI108 vs 1.112 PSL Wafer →
1430 VPZeiss
CategoryMetrology & Inspection
1 spec
MI108 vs 1430 VP →
1450 VPLEO

The LEO 1450 VPSE is a variable-pressure scanning electron microscope (SEM) platform with mounted EDS microanalysis, a BSE detector system, active isolation, and dedicated control terminals.

CategoryMetrology & Inspection
2 specs
MI108 vs 1450 VP →