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Hitachi

S-5500

Metrology & InspectionHitachi S-5500 family
Research Quality: 30% complete
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Fig. — Manufacturer logo, not a photo of this toolWikimedia Commons (see file page for license)
  • Plate 01Used HITACHI S-5500 FE SEM- Inspection Video

    ASE SEMICONDUCTORWatch on YouTube

Gas delivery

Energy dispersive spectroscopy (EDS)[1]

Optics

Sub-nanometer resolution[1]

What is it?

The Hitachi S-5500 SEM/STEM is listed in the Electron Microscopy Facility and has a dedicated equipment page. The source states that it provides sub-nanometer resolution, can image in scanning transmission electron microscopy (STEM) mode, includes a bright-field/dark-field Duo-STEM detector for simultaneous BF and DF imaging, and has energy dispersive spectroscopy (EDS) for nanometer-scale chemical composition probing.

What can it run?

Process applications and technology nodes documented for this tool.

  • SEM imaging
  • STEM imaging
  • Chemical composition probing at nanometer scale

What do the numbers mean?

Gas & chemistry1

Chemical analysis
Energy dispersive spectroscopy (EDS)[1]
Accurate?

Optics & imaging2

Resolution
Sub-nanometer resolution[1]
Accurate?
Detector
Bright field (BF) and dark field (DF) Duo-STEM detector[1]
Accurate?

Configuration & options2

Equipment type
Electron Microscopy; Scanning Electron Microscopes (SEM)[1]
Accurate?
Imaging modes
SEM and STEM[1]
Accurate?
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Chemical analysisEnergy dispersive spectroscopy (EDS)[1]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Not publicly documented

The following facts about the S-5500 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the S-5500 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the S-5500 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the S-5500 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the S-5500 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the S-5500 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]tmi.utexas.edutmi.utexas.edutmi.utexas.edu
  2. [2]Electron Microscopy Facilitytmi.utexas.edutmi.utexas.edu
  3. [3]Instrumentationtmi.utexas.edutmi.utexas.edu
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Last updated Jul 29, 2026.

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