Waferpedia

Hitachi

S 7800 DR-SEM

Metrology & Inspection
Research Quality: 30% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The Hitachi S 7800 is a Critical Dimension Scanning Electron Microscope (CD-SEM) used for measuring critical dimensions on 8-inch wafers. The S 7800 achieves a standard resolution of 5 nm at 1 kV and a high-resolution mode of 1 nm in Single Spot X/Y Mode. The S 7800 includes stage travel of 0–200 mm in X and Y, and a throughput of 5 wafers per hour.[1]

Hitachi logo
Fig. — Manufacturer logo, not a photo of this toolWikimedia Commons (see file page for license)

Vacuum

Vacuum pumps not included[1]

Performance

Static 3 Sigma ±0.010 µm[1]

Optics

5 nm @ 1 kV[1]

What it is

The Hitachi S 7800 is a critical dimension scanning electron microscope (CD-SEM) designed for metrology and inspection. The S 7800 accepts 8-inch wafers. The S 7800 achieves a standard resolution of 5 nm at 1 kV. In high-resolution mode (Single Spot X/Y Mode), the resolution is 1 nm. Low magnification resolution (W/Z Mode) is 5 nm. Measurement precision is static 3 sigma ±0.010 µm. Positioning accuracy (X/Y) is ±15 µm. Rotation precision is ±60 µm. Pre-alignment accuracy (X/Y) is ±15 µm. Stage travel ranges are X and Y 0–200 mm, Z 4–12 mm, rotation 0–360°, and tilt 0–60°. Throughput is 5 wafers per hour. The vacuum system does not include vacuum pumps. Additional hardware includes a chiller and a transformer. Software features include AutoLive Software, Automatic Beam Current Control, Automatic Sample Control, Automatic Defect Review, and Automatic Navigation.[1]

Why won't it start?

Documented failure modes, common issues, and field considerations.

  • Stage vibration at higher magnifications
  • Hard disk defective
  • Process chamber has surface rust

What do the numbers mean?

Vacuum & pumping1

Vacuum System
Vacuum pumps not included[1]
Accurate?

Wafer handling1

Throughput
5 wafers/hour[1]
Accurate?

Optics & imaging3

Resolution (standard)
5 nm @ 1 kV[1]
Accurate?
High-Resolution Mode
1 nm (Single Spot X/Y Mode)[1]
Accurate?
Low Magnification Resolution
5 nm (W/Z Mode)[1]
Accurate?

Performance4

Measurement Precision
Static 3 Sigma ±0.010 µm[1]
Accurate?
Positioning Accuracy (X/Y)
±15 µm[1]
Accurate?
Rotation Precision
±60 µm[1]
Accurate?
Pre-Alignment Accuracy (X/Y)
±15 µm[1]
Accurate?

Control & software1

Software
AutoLive Software, Automatic Beam Current Control, Automatic Sample Control, Automatic Defect Review, Automatic Navigation[1]
Accurate?

Configuration & options6

Stage Travel X
0–200 mm[1]
Accurate?
Stage Travel Y
0–200 mm[1]
Accurate?
Stage Travel Z
4–12 mm[1]
Accurate?
Rotation (R)
0–360°[1]
Accurate?
Tilt (T)
0–60°[1]
Accurate?
Additional Hardware
Chiller, Transformer[1]
Accurate?
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Vacuum SystemVacuum pumps not included[1]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Frequently asked questions

What wafer size does the Hitachi S 7800 support?

The S 7800 supports 8-inch wafers.[1]

What is the standard resolution of the S 7800?

The standard resolution is 5 nm at 1 kV.[1]

What is the throughput of the S 7800?

The throughput is 5 wafers per hour.[1]

What is the stage travel range of the S 7800?

Stage travel ranges are X and Y 0–200 mm, Z 4–12 mm, rotation 0–360°, and tilt 0–60°.[1]

Not publicly documented

The following facts about the S 7800 DR-SEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the S 7800 DR-SEM are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the S 7800 DR-SEM are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the S 7800 DR-SEM are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • The process node or technology generation of the S 7800 DR-SEM is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the S 7800 DR-SEM are on record.

    Answerable by: an OEM parts catalog or a service engineer

Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing
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Last updated Aug 20, 2026.

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