KLA
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The KLA Visedge CV 300 main body houses a monitor, keyboard, trackball mouse, a CANDELA (ADC MUX) unit, a system computer, a pneumatic module, a motion control unit, a system power box, and a 12 inch stage unit. The equipment front end module of the KLA Visedge CV 300 provides two load ports, a robot assembly, and a prealigner. The KLA Visedge CV 300 also includes an interlock controller in the front end module.[1]
Edge integrity is critical in wafer-level packaging, where individual die are handled while still attached to the wafer. Edge inspection is also used before dicing to catch cracks that could destroy die during separation.
The KLA Visedge CV 300 is used for wafer edge defect detection.[2]
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The main body of the KLA Visedge CV 300 includes a monitor, keyboard, trackball mouse, a CANDELA (ADC MUX) unit, a system computer, a pneumatic module, a motion control unit, a system power box, and a 12 inch stage unit.[1]
The following facts about the Visedge CV 300 Edge Defect are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Visedge CV 300 Edge Defect are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Visedge CV 300 Edge Defect are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Visedge CV 300 Edge Defect are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Visedge CV 300 Edge Defect are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Visedge CV 300 Edge Defect is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Aug 20, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA 0035235-003 MMD Head is a TSTD PCB ASSY, MMD MEAS HEAD compatible with the KLA AIT-XP.