Koh Young
Koh Young Zeith 2 is a 3D AOI (Automated Optical Inspection) system. The Koh Young Zeith 2 operates at 220 V, single phase, 50/60 Hz, with a maximum current of 10 A and capacity of 2.2 kW.[1][2][3]

An automated optical inspection tool is typically positioned for noncontact inspection after assembly operations. The tool is used to verify surface condition, solder quality, and component placement without altering the workpiece.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
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The following facts about the Zeith 2 3D AOI are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Zeith 2 3D AOI are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Zeith 2 3D AOI are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Zeith 2 3D AOI are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Zeith 2 3D AOI are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Zeith 2 3D AOI is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 13, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.