LTX-Credence
The LTX-Credence PAXac is a tester. The PAXac configuration includes SSBA: 1, OVI: 2, HCOVI: 2, AWG_HSB: 1, DIG_HB: 1, FX1: 2, FX1_TMBD: 1, and RF16 (DragonRF): 1.[1][2]

The LTX-Credence PAXac is a semiconductor tester used in the test and probe segment of integrated circuit manufacturing. Testers of this class apply electrical stimuli to devices and measure responses to verify functional and parametric performance.
A semiconductor tester like the PAXac operates by connecting to a device under test (DUT) through a test interface that routes signals between the tester's instrument channels and the DUT pads or pins. The tester generates stimulus waveforms, applies power supplies, and measures the resulting responses, comparing them against expected limits. The architecture typically includes digital pattern generators, analog waveform sources, and measurement digitizers.
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The following facts about the PAXac are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the PAXac are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the PAXac are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the PAXac are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the PAXac are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the PAXac is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Last updated Oct 11, 2026.
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