BX 60 M

Metrology and inspection microscopes are optical instruments used to examine surface features, defects, pattern fidelity, and material condition at magnification. Metallurgical microscopes of this class are configured for reflected-light observation, which suits opaque samples such as metals, ceramics, semiconductor pieces, and packaged devices.

A reflected-light microscope directs illumination through the objective onto the sample surface and returns the image through the same optical path for viewing. Brightfield observation emphasizes general surface appearance and contrast from reflectivity, while darkfield observation emphasizes scattered light from edges, particles, pits, scratches, and other topographic irregularities. A trinocular head allows direct visual inspection while also providing a camera port for image capture or documentation.

Metrology and inspection microscopes of this class are used for surface inspection of opaque materials, including metallographic specimens, ceramic sections, semiconductor pieces, and other engineered surfaces. Typical uses include checking surface finish, contamination, cracks, grain structure after preparation, edge condition, and visible pattern or feature integrity.