Orbotech
The Orbotech Ultra Fusion Series is an inspection system. The Orbotech Ultra Fusion Series has a minimum line/space of 5/5 μm and a minimum defect size of 1.2 μm.[1]
The Orbotech Ultra Fusion Series supports magnification from 220x to 5000x. The Orbotech Ultra Fusion Series has a field of view from 1.2 mm to 0.19 mm. The Orbotech Ultra Fusion Series uses three independently controlled LED-based white illumination types: coaxial, diffusive, and grazing. The Orbotech Ultra Fusion Series also includes controllable UV illumination. The Orbotech Ultra Fusion Series includes autofocus and image processing. The Orbotech Ultra Fusion Series has an average time between defects of 0.7 seconds. The Orbotech Ultra Fusion Series uses a 23 inch image display and runs on Linux.[1][2]
Optical inspection tools are typically used after patterning, etch, deposition, clean, or other unit processes when a fab needs to verify pattern integrity or search for visible defects. Inspection data from tools in this class can feed process monitoring, engineering review, and yield analysis workflows.
Inspection systems of this class are applied to patterned surfaces where optical contrast can reveal contamination, missing or extra material, scratches, bridging, opens, and other visible anomalies. Metrology and inspection tools of this class are used in process development, excursion response, and routine manufacturing monitoring.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The Orbotech Ultra Fusion Series is an inspection system in the metrology and inspection category.[1][2][3]
The Orbotech Ultra Fusion Series has a minimum line and space capability of 5/5 μm.[1][2][3]
The following facts about the Ultra Fusion Series are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Ultra Fusion Series are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Ultra Fusion Series are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Ultra Fusion Series are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Ultra Fusion Series are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Ultra Fusion Series is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Last updated Oct 16, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.