Sonix
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Scanning acoustic microscopes are metrology and inspection tools that use focused ultrasound to examine internal structure without cutting the sample open. Scanning acoustic microscopes are used to reveal hidden interfaces and structural defects inside packaged devices and related assemblies.
Scanning acoustic microscopes generally transmit ultrasonic energy into a sample through a liquid coupling path and analyze the returning signal to form an image of subsurface features. Scanning acoustic microscopes generally localize defects by changes in acoustic reflection and transmission at internal boundaries.
Scanning acoustic microscopes are typically used after assembly or bonding operations when subsurface integrity must be checked without destroying the part. Scanning acoustic microscopes are commonly used in failure analysis, qualification, and production inspection workflows rather than as patterning or material removal tools.
Sonix scanning acoustic microscopes are used to diagnose device failures, monitor production sampling, and qualify new package designs.[3]
Documented failure modes, common issues, and field considerations.
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Sonix scanning acoustic microscopes are used to diagnose device failures, monitor production sampling, and qualify new package designs.[3]
The following facts about the UHR 2001 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the UHR 2001 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the UHR 2001 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the UHR 2001 are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the UHR 2001 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the UHR 2001 are on record.
Answerable by: an OEM parts catalog or a service engineer
Last updated Oct 20, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.