Teradyne
The Teradyne Ultra Flex SC UP 800 is a tester.[1]
A test and probe system positions electrical probes against device pads or wafer-level structures so the device can be electrically exercised before downstream assembly. The class commonly combines probe positioning with test instrumentation so the tool can contact a die or wafer, apply signals, and measure responses.
Test and probe systems are used for wafer probing, device characterization, and production test at the wafer stage. The class supports electrical validation of semiconductor devices before later manufacturing steps.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The Teradyne Ultra Flex SC UP 800 is a tester.[1]
The following facts about the Ultra Flex SC UP 800 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Ultra Flex SC UP 800 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Ultra Flex SC UP 800 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Ultra Flex SC UP 800 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Ultra Flex SC UP 800 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Ultra Flex SC UP 800 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Last updated Oct 13, 2026.
The Tenney TPS JR-A-F4T is a junior compact temperature test chamber with a 1.2 cubic foot chamber size and a temperature range of -68°C to +180°C.
The Rorze 03 RR 8120-001-001 is a wafer exchanger for 8-inch wafers.