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Thermo Fisher

Scientific FEI Helios NanoLab 660 FIB-SEM

Thermo Fisher logo
Fig. — Manufacturer logo, not a photo of this toolWikimedia Commons (see file page for license)

What is it?

Thermo Fisher Scientific / FEI Helios NanoLab 660 is a dual-beam FIB-SEM with an Elstar UC SEM column, Tomahawk ion column, and a 6-inch piezo stage.

What do the numbers mean?

Optics & imaging4

Elstar UC SEM Column, SE Detectors (ETD/TLD)[1]
Accurate?
Tomahawk Ion Column, ICE Detectors[1]
Accurate?
Navigation Camera+[1]
Accurate?
CCD Camera[1]
Accurate?

Control & software1

Xt. 10.x.x User Interface Operating System[1]
Accurate?

Configuration & options5

Dual Beam[1]
Accurate?
6-inch piezo stage[1]
Accurate?
PT GIS[1]
Accurate?
Plasma Cleaner[1]
Accurate?
Microsoft Windows 7 Operating System[1]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Not publicly documented

The following facts about the Scientific FEI Helios NanoLab 660 FIB-SEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Scientific FEI Helios NanoLab 660 FIB-SEM are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Scientific FEI Helios NanoLab 660 FIB-SEM are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Scientific FEI Helios NanoLab 660 FIB-SEM are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Scientific FEI Helios NanoLab 660 FIB-SEM are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Scientific FEI Helios NanoLab 660 FIB-SEM is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]inventory listing
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Last updated Jul 29, 2026.

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