UF 3000 Automatic Wafer alternatives

Test & Probe

Electroglas EG 4090 u+ is a test and probe system used to electrically characterize semiconductor devices at the wafer level. Machines of this class combine precision wafer positioning with electrical measurement so individual dies or structures can be contacted and evaluated before singulation and later assembly.

Test & Probe

Test & Probe

Semics Opus 3 is a test and probe system used to evaluate semiconductor devices and wafers at the electrical test stage. It belongs to the class of equipment that brings measurement hardware into contact with device pads or probe sites so electrical characteristics can be assessed before later assembly or final release.

Test & Probe

The Tokyo Electron Precio Automatic Wafer Prober is a 12-inch automatic wafer prober.

Test & Probe

Tokyo Electron Precio Octo is a prober with source-stated wafer sizes ranging from 4 inch to 8 inch.

Test & Probe

Tokyo Electron Precio XL is a prober described with single open with open loader, focus OCR, hot chuck, WAPP, 93K DD interface, Flip SACC, and GPIB.