Tokyo Electron
Precio Octo
How it works
The TELPADS-O function is an automated probe mark inspection system that uses a high-speed engine to inspect all pads and all wafers, produce quantitative quality-control data for probe marks, and reduce operator interaction by eliminating manual microscope inspection.[7]
What do the numbers mean?
Power & electrical1
- 50/60 Hz[1]
Wafer handling3
Control & software1
- GPIB Interface[2]
Configuration & options4
Vintage & configurations
Documented models & variants
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Precio Octo, 4-5 inch special configuration | — | — | Special configuration for 4-5 inch wafers. | Equipment inventory listing[3] |
| Precio Octo, ambient-hot temperature range configuration | — | — | Configured for 4 to 8 inch wafers with ambient-hot temperature range. | Equipment inventory listing[6] |
| Precio Octo, 8-inch gold hot & cold chuck top system | — | — | Includes CPU VIP3A, chiller C255, right side single top loader, and GPIB interface. | Equipment inventory listing[2] |
| Precio Octo | — | 2011 | Special configuration for 4-5 inch wafers. | Equipment inventory listing[3] |
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Accretech UF 3000 Automatic Wafer— Same function class: Test & Probe, UnknownCompare in depthsource[1]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- Configuration50/60 Hz[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What does a test and probe system do?General reference — not yet source-verified
It makes temporary electrical contact to wafer-level devices or structures so their electrical behavior can be measured before later manufacturing steps.
What is measured with this class of equipment?General reference — not yet source-verified
Such systems are used to evaluate basic electrical properties, continuity, leakage, and other wafer-level characteristics defined by the test program.
Where is this equipment used in semiconductor production?General reference — not yet source-verified
It is used in the wafer test stage, after fabrication and before assembly, packaging, or other downstream processing.
Why is probing done at the wafer level?General reference — not yet source-verified
Wafer-level probing helps screen devices early, support process control, and reduce the amount of downstream work applied to nonconforming material.
What is the main mechanism in this class of machine?General reference — not yet source-verified
The main mechanism is precise alignment and controlled contact between the probe assembly and wafer contact pads or test structures.
Not publicly documented
The following facts about the Precio Octo are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Precio Octo are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the Precio Octo are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Precio Octo are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Precio Octo is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the Precio Octo are on record.
Answerable by: an OEM parts catalog or a service engineer
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (7)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]Inventory photo
- [6]inventory listing
- [7]TELPADS-O | Tokyo Electron — tel.com (Jan 14, 2011)web.archive.org
Last updated Jul 30, 2026.
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