Waferpedia

Tool family

Electroglas EG 2001

Models in this family

  1. The Electroglas 2001 CX Automatic Wafer Prober is an automatic wafer prober designed for wafer test and sort.

  2. The Electroglas 2001X is an automatic wafer prober used for semiconductor wafer probing, parametric test, and device characterization.

  3. Cited variants

    DesignationGenerationVintageChangesSource
    EG 2001 Prober - Hot chuckDescribed as a hot chuck prober.Equipment inventory listing[1]
  4. Electroglas EG 2001 X Automatic Wafer Prober is an automatic wafer prober with mapping capabilities.

All entries

  1. 2001 CXElectroglas
    CategoryTest & Probe
    1 spec
  2. 2001 CX Automatic WaferElectroglas

    The Electroglas 2001 CX Automatic Wafer Prober is an automatic wafer prober designed for wafer test and sort.

    CategoryTest & Probe
    11 specs
  3. 2001 XElectroglas

    The Electroglas 2001X is an automatic wafer prober used for semiconductor wafer probing, parametric test, and device characterization.

    CategoryTest & Probe
    4 specs
  4. EG 2001Electroglas
    CategoryTest & Probe
    1 spec
  5. EG 2001 XElectroglas
    CategoryTest & Probe
    1 spec
  6. EG 2001 X Automatic WaferElectroglas

    Electroglas EG 2001 X Automatic Wafer Prober is an automatic wafer prober with mapping capabilities.

    CategoryTest & Probe
    1 spec

Sources

Sources (1)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing