EG 2001

The Electroglas EG 2001 is a prober in the Test & Probe equipment category. The Electroglas EG2001 prober is an automatic system designed to probe semiconductor wafers. The EG 2001 family includes a hot chuck configuration.^[3][4][2]

Wafer probers bring a wafer into controlled contact with a probe card so test instrumentation can measure devices before singulation. A prober class machine handles wafer loading, wafer positioning, alignment, touchdown, and stepping from die to die under programmed control. Probe stations of this class are built around a chuck, motion stages, alignment optics, and interfaces to external electrical test systems.

Wafer probing sits after front-end wafer fabrication and before dicing, assembly, and final packaged test. Probe results are used to screen die, characterize electrical behavior, and support disposition of wafers before downstream packaging work begins. In production and engineering flows, probers also support feedback to process control by linking measured electrical behavior to fabrication conditions.

Wafer probers are used for wafer sort, parametric measurements, device characterization, and engineering debug on completed wafers. Such systems are applied where electrical contact must be made repeatedly across many die locations with controlled alignment and touchdown. Probe platforms of this class are also used with temperature-conditioned chucks when test conditions require thermal control during contact.