Electroglas EG 4090

Models in this family

1. 

   4090

   The Electroglas 4090 is a test and probe system used for electrical evaluation of semiconductor devices and wafers. Machines of this class combine probing hardware with measurement functions to contact selected test points and collect device data.

   Cited variants

   Designation	Generation	Vintage	Changes	Source
   4090+ Prober	—	—	—	Equipment inventory listing[1]
   Electroglas 4090 with ETS 200 Tester	—	—	Configured with an ETS 200 Tester	Equipment inventory listing[2]
   Electroglas 4090 with LTX / Credence ASL 1000 Tester	—	—	Configured with an LTX / Credence ASL 1000 Tester	Equipment inventory listing[3]

2. 

   4090 F
3. 

   4090 FX Film Frame
4. 

   4090 u Film Frame
5. 

   4090 u+produced 1998–

   The Electroglas 4090 u+ is a prober.

   Cited variants

   Designation	Generation	Vintage	Changes	Source
   Horizon 4090	—	—	—	sec.gov[4]
   Horizon 4090u (micro)	—	1998	Targeted to ship in the first half of 1998.	sec.gov[4]
   Horizon 40901+ Fast Probe	—	—	Described as the fast probe version for high throughput of small die on 200 mm wafers.	web.archive.org[5]

6. EG 4090
7. 

   EG 4090 Automatic Wafer

   Cited variants

   Designation	Generation	Vintage	Changes	Source
   EG 4090 Automatic Wafer Prober - Nickel Chuck - Hot Chuck Temp - Airblower: IH - Thinwafer - Armsize: IH Bernoulli	—	2003–2003	Variant described with nickel chuck, hot chuck temp, airblower IH, thinwafer, and armsize IH Bernoulli.	Equipment inventory listing[6]
   EG 4090 Automatic Wafer Prober - Nickel Chuck - Hot Chuck Temp - Airblower: IH - Armsize: IH Big	—	2004–2004	Variant described with nickel chuck, hot chuck temp, airblower IH, and armsize IH Big.	Equipment inventory listing[7]
   EG 4090 Automatic Wafer Prober - Nickel Chuck - Hot Chuck Temp - Armsize: Small	—	2004–2004	Variant described with nickel chuck, hot chuck temp, and armsize Small.	Equipment inventory listing[8]

8. 

   EG 4090 u Automatic Wafer

   The Electroglas EG 4090 u is an automatic wafer prober.

   Cited variants

   Designation	Generation	Vintage	Changes	Source
   Electroglas EG 4090 u Automatic Wafer Prober	—	—	—	Equipment inventory listing[9]

9. 

   EG 4090 u+

   Electroglas EG 4090 u+ is a test and probe system used to electrically characterize semiconductor devices at the wafer level. Machines of this class combine precision wafer positioning with electrical measurement so individual dies or structures can be contacted and evaluated before singulation and later assembly.

   Cited variants

   Designation	Generation	Vintage	Changes	Source
   EG 4090 u	—	—	—	Equipment inventory listing[10]

Sources