Waferpedia

Electroglas

4090 u+

Test & ProbeProduced 1998–Electroglas EG 4090 family
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4090 u+ — Inventory photo
Fig. 014090 u+Inventory photo[2]

Produced

1998–

Power

115V[2]

What it is

General reference — not yet source-verified

A wafer prober is a machine that positions each die on a wafer so probe pins can contact the die pads and connect the device under test to external test electronics. Machines of this class are used to support electrical testing at the wafer stage before singulation and packaging.

Where it fits in the process flow

Semiconductor manufacturers use automatic wafer probers during wafer sort, before the separation and packaging of individual devices. In that part of the flow, parametric or functional tests are run at the wafer level to identify devices that meet specification and to support process control.[1]

Applications

The 4090u+ is intended for fast probing of small die on 200 mm wafers and for production environments that require high throughput.[3]

Wafer probers of this class are used for wafer sort, in-line testing, and end-of-line testing to verify electrical parameters or identify devices that do not conform to specification.[1]

What do the numbers mean?

Power & electrical2

Voltage
115V[2]
Accurate?
Frequency
60 Hz[2]
Accurate?

Configuration & options3

With:[2]
Accurate?
Olympus SZ30 microscope head[2]
Accurate?
GSWH20X/12.5 eyepieces[2]
Accurate?

Vintage & configurations

  1. 1998Production start[1]
  2. 1998Targeted shipment[1]

    Horizon 4090u micro was targeted to ship in the first half of 1998.

Documented models & variants

DesignationGenerationVintageChangesSource
Horizon 4090sec.gov[1]
Horizon 4090u (micro)1998Targeted to ship in the first half of 1998.sec.gov[1]
Horizon 40901+ Fast ProbeDescribed as the fast probe version for high throughput of small die on 200 mm wafers.web.archive.org[3]
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Voltage115V[2]
  • Frequency60 Hz[2]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

Where in the semiconductor flow is a wafer prober used?

It is used primarily during wafer sort, before devices are separated and packaged.[1]

Not publicly documented

The following facts about the 4090 u+ are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • The control-system platform and OS era of the 4090 u+ are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the 4090 u+ are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the 4090 u+ is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the 4090 u+ are on record.

    Answerable by: an OEM parts catalog or a service engineer

  • No publicly hosted manuals, SOPs, or datasheets for the 4090 u+ are on record.

    Answerable by: university cleanroom staff or an OEM application specialist

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Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]sec.govsec.gov (Mar 30, 1998)sec.gov
  2. [2]Inventory photo
  3. [3]web.archive.orgelectroglas.com (Oct 28, 2021)web.archive.org
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Last updated Jul 29, 2026.

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