HP / Verigy V 5000

Test and probe equipment is used to make electrical contact to semiconductor devices or wafers and to apply programmed stimuli while measuring the electrical response. Testers in this class are part of electrical verification and screening workflows rather than deposition, lithography, or etch.

Testers of this class operate by routing instrument signals through an interface path to the device under test, then evaluating the measured response against programmed limits. Probe-based configurations commonly rely on contact hardware between the tester and the semiconductor device so that parametric or functional checks can be executed under controlled conditions.

Test and probe tools sit in the electrical characterization and disposition part of semiconductor manufacturing. Test and probe operation commonly occurs after earlier fabrication steps have created structures that can be contacted electrically, and before later assembly or release decisions that depend on pass or fail results.

Equipment in the test and probe class is used for electrical verification, fault isolation, and screening of semiconductor devices or wafers. Probe-contact measurement supports workflows such as checking continuity, response to applied signals, and other device behaviors needed for engineering evaluation or production disposition.