MPT 3000 EV 2

A test and probe system is semiconductor production equipment used to make electrical contact to a device or wafer so measurements can be performed before later assembly or shipment. Test and probe equipment generally links instrumentation, contact hardware, handling, and control software to verify device behavior against defined limits.

Test and probe equipment applies electrical stimuli through contact hardware and measures the resulting signals from the device under test. Test and probe equipment typically relies on a controlled interface between the tester and dedicated interface hardware so the same platform can be adapted to different device types and test programs.

Test and probe equipment sits in the electrical verification portion of semiconductor manufacturing, after device fabrication has created structures that can be contacted for measurement and before downstream packing or final outgoing quality release. Probe and test operations are used to separate passing and failing devices, support process monitoring, and feed disposition data into later manufacturing decisions.

Test and probe systems are used for electrical characterization, production screening, and fault isolation on semiconductor devices. Test and probe systems are applied where repeatable contact and measurement are needed to confirm functional behavior, parametric limits, or yield trends.