Advantest
V 93000 P 1000
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Advantest V 93000 P 1000 is a semiconductor test system. The Advantest V 93000 P 1000 is categorized under Test & Probe equipment. The Advantest V 93000 P 1000 is part of the Advantest V 93000 family.[1][2]
What it is
How it works
General reference — not yet source-verifiedThe V 93000 P 1000 operates as an automated test equipment (ATE) system, applying electrical signals to a device under test to verify its functionality and performance.
The system is designed to work with probe stations to test devices at the wafer level, making electrical contact through probe needles.
Where it fits in the process flow
General reference — not yet source-verifiedThe V 93000 P 1000 is used in the test and probe stage of semiconductor manufacturing, after wafer fabrication and before final packaging.
The system is typically deployed in a cleanroom environment to prevent contamination of wafers during testing.
Applications
General reference — not yet source-verifiedThe V 93000 P 1000 is applied to test a wide range of semiconductor devices, including digital, mixed-signal, and RF integrated circuits.
The system is commonly used in high-volume production testing to ensure that manufactured devices meet specified electrical characteristics.
What do the numbers mean?
Configuration & options6
- parts machine[3]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What kinds of checks are performed by this class of equipment?General reference — not yet source-verified
Such systems commonly perform continuity, functional, timing, and parametric electrical tests, depending on the device and the test program.
Why is probe testing important?General reference — not yet source-verified
Probe testing helps identify defective die early, supports yield control, and reduces the chance that failing devices move into later manufacturing or assembly steps.
Not publicly documented
The following facts about the V 93000 P 1000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the V 93000 P 1000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the V 93000 P 1000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the V 93000 P 1000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the V 93000 P 1000 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the V 93000 P 1000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]waferpedia.com — waferpedia.comwaferpedia.com
- [2]Equipment inventory listing
- [3]inventory listing
Last updated Oct 13, 2026.
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