Agilent
11729 C Carrier Noise Test Set
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
The instrument can up-convert an external or internal reference signal and down-convert the signal under test to an intermediate frequency. It performs phase demodulation of phase noise using the Phase Detector Method and frequency demodulation of phase noise using the Frequency Discriminator Method.[1]
How it works
General reference — not yet source-verifiedThe Carrier Noise Test Set operates by processing the signal under test through frequency translation and demodulation stages. It uses a phase-locked loop or reference signal to translate the test signal to a lower intermediate frequency, where phase and frequency fluctuations can be extracted and analyzed.
Where it fits in the process flow
General reference — not yet source-verifiedThe Carrier Noise Test Set is used after signal generation or mixing stages in RF and microwave test systems. It is not a production wafer fabrication tool but rather a test and measurement instrument employed in engineering labs or qualification benches for evaluating the spectral purity of signal sources.
Applications
General reference — not yet source-verifiedPrimary applications include characterization of phase noise in oscillators, synthesizers, and other signal generators. It is used in research, development, and production testing of communication systems, radar systems, and any application requiring low-noise signal sources.
What do the numbers mean?
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
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Not publicly documented
The following facts about the 11729 C Carrier Noise Test Set are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
Fewer than 3 independently cited specifications for the 11729 C Carrier Noise Test Set are on record; the remainder await public documentation.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 11729 C Carrier Noise Test Set are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 11729 C Carrier Noise Test Set are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 11729 C Carrier Noise Test Set are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 11729 C Carrier Noise Test Set are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
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Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]4gte.com — 4gte.com4gte.com
- [2]Equipment inventory listing
Last updated Aug 12, 2026.
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