Signatone
1160
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
The station incorporates a microscope equipped with 4X, 20X, and 40X objectives for viewing samples and capturing digital images. The tool can accommodate samples of any size and is connected to a computer with internet access.[2]
How it works
General reference — not yet source-verifiedIn operation, a technician loads a wafer or packaged device onto the probe station chuck. Using the microscope and precision micromanipulators, probes are manually positioned to contact specific test pads. Electrical signals are then applied and measured through the probes to characterize the device's parameters.
Where it fits in the process flow
General reference — not yet source-verifiedProbe stations are used in semiconductor test and characterization following wafer fabrication and prior to packaging. They enable direct electrical testing of individual die or test structures on a wafer, providing feedback on process performance and device yield.
What do the numbers mean?
Optics & imaging2
Control & software1
Configuration & options6
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What objective magnifications are available on the Signatone 1160 microscope?
The microscope is equipped with 4X, 20X, and 40X objectives.[2]
Can the Signatone 1160 be used for parametric probing?
Yes, the tool can be set up for parametric probing of devices.[2]
What type of samples can the Signatone 1160 accommodate?
The station can accommodate any size sample.[2]
Not publicly documented
The following facts about the 1160 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 1160 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 1160 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 1160 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 1160 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 1160 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]Equipment inventory listing
- [2]nfc.arizona.edu — nfc.arizona.edunfc.arizona.edu
Last updated Aug 12, 2026.
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