Cascade Microtech
11000
Plate 01Cascade Microtech 11000 Probe Station #60021
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What it is
The Cascade Microtech Summit 11000 is a manual wafer probing system. The system is part of the company's 200 mm wafer probing systems. The Summit 11000 is designed for DC and RF device characterization, wafer-level reliability, e-test, modeling, and yield enhancement. The system reduces noise, leakage, stray capacitance, and measurement settling times.[3]
Where it fits in the process flow
General reference — not yet source-verifiedThe Summit 11000 is used in semiconductor test and characterization. The station is typically located in a laboratory or cleanroom environment. The station is used after wafer fabrication to evaluate device performance. The station is also used during process development and failure analysis. The station provides feedback to the fabrication process.
Applications
General reference — not yet source-verifiedThe Summit 11000 is used for a variety of test applications. The station supports DC parametric testing of transistors and other devices. The station supports RF characterization for high-frequency devices. The station is used for wafer-level reliability testing such as electromigration and hot carrier injection. The station is used for yield enhancement and process monitoring.
What do the numbers mean?
Power & electrical1
- Three Pico Probe Power Supplies (one for parts only)[2]
Vacuum & pumping4
Configuration & options6
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What wafer size does the Summit 11000 support?
The Summit 11000 is a 200 mm wafer probing system.[3]
What types of measurements can the Summit 11000 perform?
The Summit 11000 can perform DC and RF device characterization, wafer-level reliability, e-test, modeling, and yield enhancement.[3]
Is the Summit 11000 manual or automatic?
The Summit 11000 is a manual probe station.[3]
What features does the Summit 11000 have to improve measurement accuracy?
The system reduces noise, leakage, stray capacitance, and measurement settling times.[3]
Not publicly documented
The following facts about the 11000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 11000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 11000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 11000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 11000 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 11000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Cascade Microtech, Inc.:200mm Probe Stations — cascademicrotech.com (Nov 20, 2008)web.archive.org
Last updated Aug 13, 2026.
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