Applied Materials
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The Applied Materials WF 736 DUO Wafer is a wafer inspection machine. Applied Materials manufactures the WF 736 DUO Wafer. The WF 736 DUO Wafer belongs to the Metrology & Inspection equipment category.[1][2][3]

The Applied Materials WF 736 DUO Wafer is a wafer inspection machine in the metrology and inspection category.[2][1]
Wafer inspection machines examine wafers for defects, contamination, or pattern irregularities by using optical sensing, image capture, or related measurement methods.
Metrology and inspection tools support process control by comparing measured wafer conditions against expected process results.
A wafer inspection tool is typically used after a process step that can introduce particles, pattern defects, or surface anomalies, and before the next fabrication step that depends on wafer quality.
Documented failure modes, common issues, and field considerations.
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The following facts about the WF 736 DUO Wafer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the WF 736 DUO Wafer are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the WF 736 DUO Wafer are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the WF 736 DUO Wafer are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the WF 736 DUO Wafer is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the WF 736 DUO Wafer are on record.
Answerable by: an OEM parts catalog or a service engineer
Last updated Oct 12, 2026.
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KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.