Waferpedia

Filmetrics

F50-UV

F50-UV — uwaterloo.ca
Fig. 01F50-UVuwaterloo.ca[1]

Wafer size

8"

Optics

5 nm – 40 µm[2]

What is it?

The Filmetrics F50-UV is described as a thin-film metrology tool for measuring film thickness and optical characteristics by spectroscopic reflectometry, with an automated stage for efficient thickness uniformity mapping. Sources state that it supports sample sizes up to 8 inches in diameter, with a wavelength range of 190–1100 nm and a thickness measurement range of 5 nm to 40 µm.

What can it run?

Process applications and technology nodes documented for this tool.

  • measuring thin film thickness
  • measuring optical characteristics
  • collecting thickness uniformity maps

What do the numbers mean?

Wafer handling1

Substrate size
~5 mm × 5 mm to 200 mm diameter[2]
Accurate?

Optics & imaging4

Function
thin-film thickness and optical characteristics measurement[1]
Accurate?
Thickness measurement range
5 nm – 40 µm[2]
Accurate?
Minimum thickness to measure n and k
50 nm[2]
Accurate?
Wavelength range
190–1100 nm[2]
Accurate?

Configuration & options8

Vendor
Filmetrics[1]
Accurate?
Model
Filmetrics F50-UV[1]
Accurate?
Measurement method
spectroscopic reflectometry[2]
Accurate?
Automated stage
yes[1]
Accurate?
Sample size
up to 8 inches in diameter[1]
Accurate?
Spot size
1.5 mm[2]
Accurate?
Light source
deuterium + tungsten-halogen (dual light source; may choose one or both lamps)[2]
Accurate?
Measurement results visualization
2D and 3D[2]
Accurate?
Interested in this tool?
Embed spec card

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Not publicly documented

The following facts about the F50-UV are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the F50-UV are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the F50-UV are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the F50-UV are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the F50-UV are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the F50-UV is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]uwaterloo.cauwaterloo.cauwaterloo.ca
  2. [2]confluence.nanofab.ualberta.caconfluence.nanofab.ualberta.caconfluence.nanofab.ualberta.ca
  3. [3]https://www.nanofab.ualberta.ca/category/fabrication/nanofab.ualberta.cananofab.ualberta.ca
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Last updated Jul 29, 2026.

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