Waferpedia

Hitachi

S 9380 CD-SEM

Metrology & InspectionHitachi S 9380 family
Research Quality: 30% complete
S 9380 CD-SEM — Inventory photo
Fig. 01S 9380 CD-SEMInventory photo[1]

What is it?

The Hitachi S 9380 is a CD-SEM (Critical Dimension Scanning Electron Microscope).

What do the numbers mean?

Power & electrical3

Single Phase[1]
Accurate?
Frequency
60 Hz[1]
Accurate?
Voltage
100 V[1]
Accurate?

Configuration & options1

Refurbished[4]
Accurate?
Interested in this tool?
Embed spec card

What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • ConfigurationSingle Phase[1]
  • Frequency60 Hz[1]
  • Voltage100 V[1]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Frequently asked questions

What kind of tool is a CD-SEM?General reference — not yet source-verified

It is an electron-beam metrology and inspection tool that images and measures very small patterned features on a surface.

What does this class measure?General reference — not yet source-verified

It is used to evaluate the size, shape, and consistency of fine structures, especially features formed by lithography and subsequent pattern transfer.

Why use electron-beam inspection instead of optical inspection?General reference — not yet source-verified

This class is used when feature sizes or edge detail are too small for practical optical measurement and when higher spatial resolution is needed.

Where is this tool used in fabrication?General reference — not yet source-verified

It is used in the metrology and inspection flow to check pattern quality after manufacturing steps and to support process control.

What kind of output does it provide?General reference — not yet source-verified

It provides high-resolution images and measurement data that can be used to assess feature dimensions, shape variation, and local defects.

Not publicly documented

The following facts about the S 9380 CD-SEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the S 9380 CD-SEM are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the S 9380 CD-SEM are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the S 9380 CD-SEM are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the S 9380 CD-SEM are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the S 9380 CD-SEM is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (4)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]Inventory photo
  3. [3]Inventory photo
  4. [4]inventory listing
Was this page accurate?

Last updated Jul 29, 2026.

Compare with similar tools

View all →