Hitachi

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It is an electron-beam metrology and inspection tool that images and measures very small patterned features on a surface.
It is used to evaluate the size, shape, and consistency of fine structures, especially features formed by lithography and subsequent pattern transfer.
This class is used when feature sizes or edge detail are too small for practical optical measurement and when higher spatial resolution is needed.
It is used in the metrology and inspection flow to check pattern quality after manufacturing steps and to support process control.
It provides high-resolution images and measurement data that can be used to assess feature dimensions, shape variation, and local defects.
The following facts about the S 9380 CD-SEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the S 9380 CD-SEM are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the S 9380 CD-SEM are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the S 9380 CD-SEM are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the S 9380 CD-SEM are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the S 9380 CD-SEM is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Jul 29, 2026.
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