KLA
300901
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
How it works
General reference — not yet source-verifiedInspection microscopes form an enlarged optical image of a sample so an operator can examine feature appearance and surface condition. Inspection microscopes in fab use commonly combine illumination, objective optics, focus control, and a sample stage so regions of interest can be brought into view and evaluated directly.
Where it fits in the process flow
General reference — not yet source-verifiedMetrology and inspection microscopes are used across the process flow wherever visual verification is needed after a fabrication, patterning, deposition, etch, cleaning, assembly, or rework step. Microscopes in this class are commonly used near process tools, engineering benches, analytical areas, and quality functions to confirm whether material or pattern conditions match expectations before the next operation proceeds.
Applications
General reference — not yet source-verifiedSemiconductor inspection microscopes are applied to defect review, operator checks, process development, and general visual disposition work. Semiconductor inspection microscopes are used to examine patterned and unpatterned surfaces for scratches, particles, staining, cracking, edge issues, overlay appearance, and other observable anomalies.
What do the numbers mean?
Configuration & options4
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the 300901 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 300901 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 300901 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 300901 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 300901 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 300901 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]waferpedia.com — waferpedia.comwaferpedia.com
Last updated Oct 16, 2026.
Compare with similar tools
View all →The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.
