Rasco
The Rasco SO 1000 is a tri-temperature handler for semiconductor packages such as SSOP, SOIC, and TSSOP. The Rasco SO 1000 uses LN2 for cold temperature testing. The Rasco SO 1000 operates on a 230 V, 2300 W power supply and requires 5 to 10 bars of compressed air.[1]

Test handlers are automated machines used with packaged semiconductor devices during electrical test. Gravity handlers move devices along a path that relies on controlled feeding and positioning so the devices can be presented to a test interface. Test handlers belong to the back-end test area of semiconductor manufacturing rather than to wafer fabrication tools.
The SO1000 operates as a tube-to-tube gravity test handler. The SO1000 uses tube input and output with quick adjustment and four manual outputs. The SO1000 features a fast plunger with up to four plunger heads. The SO1000 has index time down to 500 ms. The SO1000 supports up to 14,000 UPH. The SO1000 supports a full tri-temp range from -60°C to +175°C with temperature accuracy of +/- 2°C.[6]
Semiconductor test handlers are used after devices have been assembled into packages and before final packing or subsequent distribution steps. A handler in this class works alongside automated test equipment by presenting packaged parts to the electrical test interface and then sorting or returning the tested parts to output media.
Documented failure modes, common issues, and field considerations.
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The SO1000 is a tube-to-tube gravity test handler.[6]
The SO1000 supports tri-temperature operation. The SO1000 has a temperature range of -60°C to +175°C, and the Rasco SO 1000 uses LN2 for cold operation.[6][1]
The SO1000 is specified for up to 14,000 UPH with index time down to 500 ms.[6]
The following facts about the SO 1000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the SO 1000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the SO 1000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the SO 1000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the SO 1000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the SO 1000 are on record.
Answerable by: an OEM parts catalog or a service engineer
Last updated Oct 20, 2026.
The Multitest MT 9510 XP is a pick-and-place handler designed for tri-temp testing of semiconductor devices, with temperature accuracy demonstrated for BGA packages.
The Tenney TPS JR-A-F4T is a junior compact temperature test chamber with a 1.2 cubic foot chamber size and a temperature range of -68°C to +180°C.
The Rorze 03 RR 8120-001-001 is a wafer exchanger for 8-inch wafers.