Thermo Fisher
Scientific FEI Nova NanoLab 200 FIB-SEM
The Scientific FEI Nova NanoLab 200 FIB-SEM is a dual-beam Ga FIB-SEM with a focused ion beam and scanning electron microscope configuration. The Scientific FEI Nova NanoLab 200 FIB-SEM has two SE detectors and no BSE detector. The Scientific FEI Nova NanoLab 200 FIB-SEM does not come with an HDD.[1][2]
What it is
The Thermo Fisher Scientific / FEI Nova NanoLab 200 FIB-SEM is a focused ion beam and scanning electron microscope system. The Thermo Fisher Scientific / FEI Nova NanoLab 200 FIB-SEM has a dual-beam Ga FIB-SEM configuration. The Thermo Fisher Scientific / FEI Nova NanoLab 200 FIB-SEM is categorized under metrology and inspection.[1][2]
How it works
The Thermo Fisher Scientific / FEI Nova NanoLab 200 FIB-SEM has two SE detectors. The Thermo Fisher Scientific / FEI Nova NanoLab 200 FIB-SEM has no BSE detector. The Thermo Fisher Scientific / FEI Nova NanoLab 200 FIB-SEM has no EDS. The Thermo Fisher Scientific / FEI Nova NanoLab 200 FIB-SEM uses a Windows XP PC system.[1][2]
Applications
General reference — not yet source-verifiedFIB-SEM systems are used for site-specific cross-sectioning, delayering, circuit edit support, defect localization, and specimen preparation for downstream microscopy. FIB-SEM systems are also used to expose subsurface structures and to inspect process features that are difficult to evaluate with surface imaging alone. In semiconductor work, such tools support failure analysis and development investigations on patterned wafers and devices.
Why won't it start?
Documented failure modes, common issues, and field considerations.
- No BSE detector
- Does not come with HDD
- Missing GIS components: XeF2 and Pt coating probes
What do the numbers mean?
Optics & imaging4
Control & software2
Configuration & options16
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the Scientific FEI Nova NanoLab 200 FIB-SEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Scientific FEI Nova NanoLab 200 FIB-SEM are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Scientific FEI Nova NanoLab 200 FIB-SEM are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Scientific FEI Nova NanoLab 200 FIB-SEM are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the Scientific FEI Nova NanoLab 200 FIB-SEM is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the Scientific FEI Nova NanoLab 200 FIB-SEM are on record.
Answerable by: an OEM parts catalog or a service engineer
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]waferpedia.com — waferpedia.comwaferpedia.com
- [3]Inventory photo
Last updated Oct 15, 2026.
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