Thermo Fisher
Scientific FEI Tecnai G 2 F 20 X-Twin TEM
The Thermo Fisher Scientific FEI Tecnai G 2 F 20 X-Twin TEM is a transmission electron microscope. The Thermo Fisher Scientific FEI Tecnai G 2 F 20 X-Twin TEM is used for metrology and inspection. The Thermo Fisher Scientific FEI Tecnai G 2 F 20 X-Twin TEM includes a Fischione M3000 HAADF detector, an Oxford X-Max 250 SDD, an EFTEM EELS module, an on-axis BF/DF detector, and an Orius SC 1000 camera.[1][2][3]
What it is
How it works
General reference — not yet source-verifiedA transmission electron microscope forms images by transmitting a high-energy electron beam through a very thin specimen and using the interactions that emerge from the specimen to build contrast and detail.
A transmission electron microscope is used with detectors, imaging cameras, and analytical attachments to observe fine structure and gather information from nanoscale features.
Where it fits in the process flow
General reference — not yet source-verifiedA transmission electron microscope is used in metrology and inspection to examine materials and structures after fabrication steps have produced the specimen or device region of interest.
A transmission electron microscope supports failure analysis, process verification, and structural characterization in workflows that depend on very high spatial resolution.
Applications
The Thermo Fisher Scientific FEI Tecnai G 2 F 20 X-Twin TEM is used for metrology and inspection.[1]
The Thermo Fisher Scientific FEI Tecnai G 2 F 20 X-Twin TEM includes a Fischione M3000 HAADF detector, an Oxford X-Max 250 SDD, an EFTEM EELS module, an on-axis BF/DF detector, and an Orius SC 1000 camera.[3][1]
What do the numbers mean?
Power & electrical2
- Compressor 115 V, 50/60 Hz[3]
Optics & imaging17
Control & software1
Configuration & options15
- Fischione M3000 HAADF[3]
- Oxford X-Max 250 SDD[3]
- 19" Accessory cabinet 33U[3]
- External scan switch facility[3]
- EFTEM EELS module[3]
- 20" LCD monitor[3]
- 1600 XP UPS[3]
- R075 Chiller[3]
- Core Instrument:[3]
- Configuration / options
- Fischione M3000 HAADF; Oxford X-Max 250 SDD; 19" Accessory cabinet 33U; External scan switch facility; EFTEM EELS module; 20" LCD monitor; 1600 XP UPS; R075 Chiller[1]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What kind of specimens can be examined with this type of instrument?General reference — not yet source-verified
Only solid specimens that are stable under vacuum and thin enough for electron transmission can be examined. Bulk materials must be prepared by thinning, while powders or nanoparticles may be dispersed on a support grid.
How does a TEM differ from a scanning electron microscope?General reference — not yet source-verified
A TEM detects electrons that pass through the specimen, providing information about internal structure and higher resolution. A scanning electron microscope detects electrons from the specimen surface, so it reveals surface morphology but not internal features.
What sample preparation is required?General reference — not yet source-verified
The area of interest must be reduced to a thin region, often by mechanical polishing, ion milling, or focused ion beam sectioning. The prepared specimen is then placed on a grid and inserted into the instrument.
What measurements can be made for metrology purposes?General reference — not yet source-verified
Quantitative measurements include layer thickness, particle size, lattice spacing, and local elemental composition when the microscope is equipped with an analytical detector.
Not publicly documented
The following facts about the Scientific FEI Tecnai G 2 F 20 X-Twin TEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Scientific FEI Tecnai G 2 F 20 X-Twin TEM are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Scientific FEI Tecnai G 2 F 20 X-Twin TEM are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Scientific FEI Tecnai G 2 F 20 X-Twin TEM are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Scientific FEI Tecnai G 2 F 20 X-Twin TEM are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Scientific FEI Tecnai G 2 F 20 X-Twin TEM is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]waferpedia.com — waferpedia.comwaferpedia.com
- [2]Thermo Fisher Scientific FEI Tecnai G 2 F 20 X-Twin TEM family | Waferpedia — waferpedia.comwaferpedia.com
- [3]Inventory photo
Last updated Oct 13, 2026.
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