Zeiss
The Carl Zeiss 1540EsB Crossbeam is a FIB/SEM system. The Carl Zeiss 1540EsB Crossbeam has an FESEM electron column with imaging performance approaching the 2 nm range. The Carl Zeiss 1540EsB Crossbeam has a Ga ion column for milling materials from the sample.[1][2][3]
The Zeiss 1540EsB Crossbeam supports imaging, milling, sputtering, and deposition applications. The Zeiss 1540EsB Crossbeam can mill material with its Ga ion column and can deposit Pt, W, and SiOx through its Gas Injection System.[3][1][2]
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The following facts about the 1540EsB are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 1540EsB are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 1540EsB are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 1540EsB are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 1540EsB are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 1540EsB is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Last updated Oct 19, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.