Accretech
UF 300 A Automatic Wafer alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Electroglas
EG 4090 u+
Test & Probe
Electroglas EG 4090 u+ is a test and probe system used to electrically characterize semiconductor devices at the wafer level. Machines of this class combine precision wafer positioning with electrical measurement so individual dies or structures can be contacted and evaluated before singulation and later assembly.
Eagle
ETS 200 T
Test & Probe
Semics
Opus 3
Test & Probe
Semics Opus 3 is a test and probe system used to evaluate semiconductor devices and wafers at the electrical test stage. It belongs to the class of equipment that brings measurement hardware into contact with device pads or probe sites so electrical characteristics can be assessed before later assembly or final release.
Tokyo Electron
Precio Automatic Wafer
Test & Probe
The Tokyo Electron Precio Automatic Wafer Prober is a 12-inch automatic wafer prober.
Tokyo Electron
Precio XL
Test & Probe
Tokyo Electron Precio XL is a prober described with single open with open loader, focus OCR, hot chuck, WAPP, 93K DD interface, Flip SACC, and GPIB.
KLA
1007
Test & Probe
The KLA 1007 is a wafer prober manufactured by KLA.
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