Accretech

Plate 01UF300A 300mm TSK/ACCRETECH Wafer Prober
Plate 02UF300A 300mm TSK/ACCRETECH Wafer Prober
Plate 03UF300 TSK/ACCRETECH Wafer Prober
Source describes the unit as 2001 vintage.
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
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The following facts about the UF 300 A Automatic Wafer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented variants, configuration options, or revision breakpoints of the UF 300 A Automatic Wafer are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the UF 300 A Automatic Wafer are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the UF 300 A Automatic Wafer are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the UF 300 A Automatic Wafer is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the UF 300 A Automatic Wafer are on record.
Answerable by: an OEM parts catalog or a service engineer
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Last updated Jul 29, 2026.
General referenceElectroglas EG 4090 u+ is a test and probe system used to electrically characterize semiconductor devices at the wafer level. Machines of this class combine precision wafer positioning with electrical measurement so individual dies or structures can be contacted and evaluated before singulation and later assembly.
General referenceSemics Opus 3 is a test and probe system used to evaluate semiconductor devices and wafers at the electrical test stage. It belongs to the class of equipment that brings measurement hardware into contact with device pads or probe sites so electrical characteristics can be assessed before later assembly or final release.
The Tokyo Electron Precio Automatic Wafer Prober is a 12-inch automatic wafer prober.